HOME
│ 產品搜尋
搜尋
繁體中文
简体中文
English
About
TAF Certified Lab
News
Products
Support
Contact Us
Links
About
TAF Certified Lab
News
Products
Support
Contact Us
Links
首頁
> Optical Measurements > Film Thickness
HMT-UVN01
Spectroscopic Ellipsometer
Wavelength range
250-1000nm or customize
Thickness reange
0nm to 10um
Resolution
1nm
Spot size
1 to 5 mm diameter
Incident angle reange
10 to 90 degree
Movement accuracy
0.01 degree
Measuring Speed
< 1 sec
Overview
〈 返回列表
│
上一筆