Home > Optical Measurements > Film Thickness
MFS-R
Film Thickness Measurement System
Wavelength range 380-950nm or custom
Thickness range 300-400,000 Angstrom
Resolution 1nm-2nm
Accurancy 1%
(Thckness >1
,000 Angstrom)
Receive mode Integrating sphere
Light source Halogen 
Measuring Speed < 1 sec
Stage Fixed or custom
Application Thin film solar cell
Optical coatings  
FPD
LCD and LED
Semiconductor and Dielectrics 
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